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Электронный каталог: Giangrandi, S. - Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films
Giangrandi, S. - Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films
Статья
Автор: Giangrandi, S.
Nuclear Instruments & Methods in Physics Research B: Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films
б.г.
ISBN отсутствует
Автор: Giangrandi, S.
Nuclear Instruments & Methods in Physics Research B: Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films
б.г.
ISBN отсутствует
Статья
Giangrandi, S.
Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films / S.Giangrandi, [et al.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2008. – Vol.266, No.24. – p.5144-50. – URL: http://dx.doi.org/10.1016/j.nimb.2008.08.018. – Bibliogr.:33.
Спец.(статьи,препринты) = С 344.1п - Методика по времени пролета
Giangrandi, S.
Low-Energy Heavy-Ion TOF-ERDA Setup for Quantitative Depth Profiling of Thin Films / S.Giangrandi, [et al.] // Nuclear Instruments & Methods in Physics Research B : Beam Interactins with Materials and Atoms. – 2008. – Vol.266, No.24. – p.5144-50. – URL: http://dx.doi.org/10.1016/j.nimb.2008.08.018. – Bibliogr.:33.
Спец.(статьи,препринты) = С 344.1п - Методика по времени пролета